During ICP-OES analysis using a SPEX multi-element standard, a laboratory observes that the measured concentration of arsenic (As) is consistently 8% higher than the certified value when analyzed in a nitric acid matrix. After verifying instrument calibration, what is the MOST likely cause of this systematic positive bias?
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A
Spectral overlap from a chlorine emission line at 193.696 nm interfering with the As 193.696 nm analytical line
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B
An argon emission line at 193.759 nm causing spectral overlap with the As 193.696 nm line in a high-matrix sample
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C
Physical interference from the high total dissolved solids content elevating plasma temperature and enhancing As emission
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D
Background emission from the nitric acid solvent matrix causing a broadband continuum elevation near the As line