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Wechsler Psychometric Properties Flashcards

7 cards from real Wechsler Test practice questions. Tap to flip, then mark Knew It or Still Learning — missed cards come back until you master them.

Read the first 7 Wechsler Psychometric Properties flashcards as text
  1. A General Ability Index (GAI) on the WAIS-IV or WISC-V is most useful because it minimizes the influence of which two domains?

    Answer: Working Memory and Processing Speed

    The GAI is derived primarily from reasoning and comprehension subtests, reducing the weight of Working Memory and Processing Speed.

  2. If a Wechsler subtest has high inter-rater reliability, this means:

    Answer: Different scorers produce similar scores for the same responses

    Inter-rater reliability reflects agreement among different examiners scoring the same performance.

  3. An examinee's Working Memory Index is significantly lower than their Verbal Comprehension Index. This is an example of analyzing what?

    Answer: Index discrepancy (profile analysis)

    Comparing differences between index scores is part of discrepancy or profile analysis.

  4. The phenomenon where extreme scores tend to move closer to the average upon retesting is known as:

    Answer: Regression to the mean

    Regression to the mean describes extreme scores drifting toward the average on subsequent testing.

  5. The gradual rise in average IQ scores over generations, which prompts periodic renorming of Wechsler tests, is called:

    Answer: The Flynn effect

    The Flynn effect refers to the long-term increase in population IQ scores over time.

  6. A ceiling effect on a Wechsler subtest occurs when:

    Answer: Items are too easy and high-ability examinees max out the score

    A ceiling effect happens when a test lacks sufficiently difficult items to differentiate high performers.

  7. Practice effects are a particular concern for which type of reliability evidence?

    Answer: Test-retest reliability

    Practice effects can inflate scores on re-administration, complicating test-retest reliability estimates.